English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 6507/11669
造訪人次 : 29927068      線上人數 : 397
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 進階搜尋

請使用永久網址來引用或連結此文件: http://ir.ncue.edu.tw/ir/handle/987654321/10132

題名: An Auto-detecting System for Surface Defects on Connectors
作者: Chen, Po-Yueh;Liao, Hsien-Chou;Chin, Kuo-Ming
貢獻者: 資訊工程學系
關鍵詞: Computer vision;Surface defect;Connector
日期: 2008-06
上傳時間: 2012-05-03T09:15:41Z
出版者: 國立勤益科技大學
摘要: Exploiting computer vision techniques, an autodetecting system is developed for surface defects on connectors. The system hardware consists of a CCD (charge-coupled device) camera, a loop-shaped lightsource, and an image capture board. Since the surface of connectors is made of stainless steel with high reflectance, it is difficult to locate the defects specifically. This problem is usually solved by applying extra light on the dark area. However, the reflection of the extra light might induce some detection errors. We classify the surface regions as some regions of interest (ROI) and ones that are not of interest (non-ROI) so as to accomplish real-time on-line diagnosis by image positioning and template recognition. Applied image processing techniques include edge detection, image segmentation, binary images, and template recognition. According to the examination results, the system effectively detects the surface defects. The Examination time is 32ms per sample.
關聯: 第三屆智慧生活科技研討會, 國立勤益科技大學, 2008年6月6日
顯示於類別:[資訊工程學系] 會議論文

文件中的檔案:

檔案 大小格式瀏覽次數
2050401016007.pdf44KbAdobe PDF595檢視/開啟


在NCUEIR中所有的資料項目都受到原著作權保護.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回饋