National Changhua University of Education Institutional Repository : Item 987654321/10430
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6507/11669
Visitors : 29951538      Online Users : 606
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/10430

Title: Complexometric Titration of Aluminum and Magnesium Ions in Commercial Antacids: An Experiment for General and Analytical Chemistry Laboratories
Authors: Yang, Shui-Ping;Tsai, Ruei-Ying
Contributors: 化學系
Date: 2006-06
Issue Date: 2012-05-23T02:28:25Z
Publisher: American Chemical Society
Abstract: Few chemical experiments use the reagents from consumer products. Student interest in chemistry usually suffers from the lack of relevance to their daily lives. Ultimately this leads to insufficient student chemical problem-solving ability. A novel experiment for determining metallic ions in commercial antacids is described. This experiment is developed with three independent protocols based on complexometric direct and back titrations containing the concepts and usages of blocking, masking, buffer controls and metallic indicators. The three protocols involve determining the total aluminum and magnesium ion contents and individual ion content. This approach is different from determining the acid-neutralizing power of anions in antacids using acid–base titration. Using statistical analyses, student and instructor data indicated good results. Student comments were positive. Thus, this experiment is feasible for general chemistry and introductory analytical chemistry laboratories.
Relation: Journal of Chemical Education, 83(6): 906-909
Appears in Collections:[Department of Chemistry] Periodical Articles

Files in This Item:

File SizeFormat
index.html0KbHTML748View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback