English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6482/11654
Visitors : 23424961      Online Users : 192
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/10712

Title: Compact tri-band BPF design using spur-line-loaded tri-section SIRS
Authors: Lee, Ching-Her;Hsu, Chung-I G.;Chen, Yu-Cheng
Contributors: 電子工程學系
Keywords: Tri-band bandpass filter;Three-section SIR;Defected ground structure
Date: 2009-04
Issue Date: 2012-05-29T01:23:28Z
Publisher: Wiley InterScience
Abstract: In this article, a new tri-band microstrip bandpass filter (BPF) is proposed. The BPF is composed of two folded, rectangular-shaped three-section SIRs (TSSIRs) whose first three resonant frequencies can be tuned to locate in the desired passbands. The BPF are 0� fed and the end sections of the TSSIRs are designed in an antiparallel fashion to produce zeros at appropriate frequencies for improving passband selectivity. In addition, by embedding spur lines and defected ground structures (DGS) in the BPF, extra transmission zeros around the first spurious passband are introduced to widen the upper stopband. The designed BPF is fabricated on an RT/Duroid 6010 substrate. The measured fractional bandwidths (minimum insertion losses) for the 1.57 GHz (GPS), 2.45 GHz (ISM), and 3.5 GHz (WiMAX) bands, respectively, are 11.5% (1 dB), 4.6% (2.19 dB), and 10.9% (1.3 dB), which agree well with those predicted by simulation. It also shows that for miniaturization purposes, the TSSIRs are made meandered to give an overall circuit size of only 23.29 � 10.94 mm2 for the designed BPF.
Relation: Microwave and Optical Technology Lett., 51(4): 989-991
Appears in Collections:[電子工程學系] 期刊論文

Files in This Item:

File SizeFormat
index.html0KbHTML456View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback