English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6480/11652
Visitors : 20674854      Online Users : 269
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/11144

Title: A Li-ion Battery Discharge Model
Authors: Chen, Liang‐Rui;Liu, Chuan Sheng
Contributors: 電機工程系
Keywords: Li-ion battery;Initial transient state part;Steady state part;Tail transient state part;Simulink model
Date: 2010-07
Issue Date: 2012-06-05T04:34:31Z
Publisher: Federico II University
Abstract: In this paper, a Simulink model for describing the Li-ion battery discharge behaviors is proposed. This model describes the response of the open-circuit voltage and closed-circuit voltage to time in the discharge process of the Li-ion battery. The Li-ion battery discharge behavior is divided into three parts: initial transient state part, steady state part, and tail transient state part. The initial transient state and the steady state parts are described by using a RC circuit respectively while a nonlinear voltage source is used to describe the tail transient state part. In addition, this model has an equivalent series resistance, used to make the electrical resistance value of the electrodes and the guard circuit equivalent. Finally, a Panasonic 18650 Li-ion battery Simulink model is implemented to verify the feasibility of the proposed method. The results of experiments and simulations show that the Li-ion battery Simulink model can accurately describe the response of the open-circuit voltage and closed-circuit voltage to time in the discharge process.
Relation: International Review of Eletrical Engineering, 5(4): 1769-1774
Appears in Collections:[電機工程學系] 期刊論文

Files in This Item:

File SizeFormat
205020610006.pdf13KbAdobe PDF1025View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback