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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/11922

Title: 半導體雷射的雜訊: 低或然率區之分佈
Semiconductor Laser Noise Distribution in the Low Probability Region
Authors: 陳國良
Contributors: 電機工程學系
Keywords: 雜訊量測;相對雜訊;誤讀率;光子分佈統計;半導體雷射;光纖通訊
Noise measurement;Relative intensity noise;Bit error rate;Photon statistics;Semiconductor lasers;Optical fiber communication
Date: 2005-08
Issue Date: 2012-07-03T01:35:45Z
Publisher: 行政院國家科學委員會
Abstract: 過去已有不少關於雷射雜訊的理論與實驗研究.大多數是針對雜訊的標準差,而假設與實驗不合的高氏分佈.因為通訊誤讀出現或然率很低,我們須要明確的知道雜訊分佈的尾端.在本計劃,我們用一種新方法量半導體雷射偶合入單模光纖的雜訊,此法量的雜訊與誤讀率有直接關連,優於只量雜訊的標準差
The laser noise has been well studied theoretically and experimentally. Most of the experimental works were concerned about the standard deviation of the noise, with the implicit assumption that the noise distribution is Gaussian, which disagrees with other publications
where the distribution is studied. We employ a new approach to measure the semiconductor laser noise distribution down to a 10-11 BER with a measurement time of less than an hour. This method takes advantage of the high sampling rate of BER testers (BERT) available today.
We found that the noise distribution for a 1310nm Fabry-Perot semiconductor laser and a 1550nm DFB semiconductor laser are well fitted by Gaussian distributions. The results have been sent and accepted for publication in IEEE Photonics Technology Letters. The paper title is “Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit Error Rate Testers”.
Relation: 計畫編號:NSC94-2215-E035-004 ;研究期間:200508-200607
Appears in Collections:[電機工程學系] 國科會計畫

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