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|Title: ||半導體雷射的雜訊: 低或然率區之分佈|
Semiconductor Laser Noise Distribution in the Low Probability Region
Noise measurement;Relative intensity noise;Bit error rate;Photon statistics;Semiconductor lasers;Optical fiber communication
|Issue Date: ||2012-07-03T01:35:45Z
The laser noise has been well studied theoretically and experimentally. Most of the experimental works were concerned about the standard deviation of the noise, with the implicit assumption that the noise distribution is Gaussian, which disagrees with other publications
where the distribution is studied. We employ a new approach to measure the semiconductor laser noise distribution down to a 10-11 BER with a measurement time of less than an hour. This method takes advantage of the high sampling rate of BER testers (BERT) available today.
We found that the noise distribution for a 1310nm Fabry-Perot semiconductor laser and a 1550nm DFB semiconductor laser are well fitted by Gaussian distributions. The results have been sent and accepted for publication in IEEE Photonics Technology Letters. The paper title is “Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit Error Rate Testers”.
|Relation: ||計畫編號:NSC94-2215-E035-004 ;研究期間:200508-200607|
|Appears in Collections:||[電機工程學系] 國科會計畫|
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