National Changhua University of Education Institutional Repository : Item 987654321/11926

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NCUEIR > College of Engineering > Department and Graduate Institute of Electronic Engineering > Periodical Articles > Item 987654321/11926

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/11926

Title:	Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit-Error-Rate Testers
Authors:	Chen, Kuo-Liang;Wang, Charlie;Wilks, John
Contributors:	電機工程系
Date:	2006-10
Issue Date:	2012-07-03T01:44:23Z
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Abstract:	Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution down to a bit-error ratio (BER) of 10-11. This method takes advantage of the high sampling rate of modern BER testers. We found that the noise distribution for a 1310-nm Fabry-P�rot laser and a 1550-nm distributed-feedback laser are well fitted by Gaussian distributions.
Relation:	IEEE Photonics Technology Letters, 18(19): 2059-2061
Appears in Collections:	[Department and Graduate Institute of Electronic Engineering] Periodical Articles

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