National Changhua University of Education Institutional Repository : Item 987654321/11926
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题名: Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit-Error-Rate Testers
作者: Chen, Kuo-Liang;Wang, Charlie;Wilks, John
贡献者: 電機工程系
日期: 2006-10
上传时间: 2012-07-03T01:44:23Z
出版者: Institute of Electrical and Electronics Engineers Inc.
摘要: Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution down to a bit-error ratio (BER) of 10-11. This method takes advantage of the high sampling rate of modern BER testers. We found that the noise distribution for a 1310-nm Fabry-P�rot laser and a 1550-nm distributed-feedback laser are well fitted by Gaussian distributions.
關聯: IEEE Photonics Technology Letters, 18(19): 2059-2061
显示于类别:[電機工程學系] 期刊論文

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