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NCUEIR > College of Engineering > Department of Mechatronics Engineering > Periodical Articles > Item 987654321/12274

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/12274

Title:	Effect of deflection on the mechanical and optoelectronic properties of indium tin oxide films deposited on polyethylene terephthalate substrates by pulse magnetron sputtering
Authors:	Lin, Yi- Cheng;Shi, W. Q.;Chen, Z. Z.
Contributors:	機電工程系
Keywords:	Indium tin oxide;Polyethylene terephthalate;Mechanical deflection;Pulse magnetron sputtering;Optical properties
Date:	2009
Issue Date:	2012-07-05T07:10:37Z
Publisher:	Elsevier B.V.
Abstract:	In this research, we studied the effect of deflection on the characteristics of an indium tin oxide (ITO) film deposited on a flexible polyethylene terephthalate flexible substrate by pulse magnetron sputtering. The experimental results show that an increase in the ITO film thickness leads to an increase in the residual stress and a decrease in the adhesion. Under power of 80 W, pulse frequency of 10 kHz, pulse reverse time of 2 μs, and ITO film thickness of 100 nm, thin film with an optimized resistivity of 4.5×10−4 Ω-cm, visible light transmittance of more than 84%, and adhesion of class 5B/0 as per the ASTM/ISO standards. Micro-cracking was observed on the ITO film surface when the film thickness was greater than 100 nm and when the deflection was carried out for 100 times. Micro-cracking led to an increase in the residual stress and deterioration in the adhesion properties.
Relation:	Thin Solid Films, 517: 1701-1705
Appears in Collections:	[Department of Mechatronics Engineering] Periodical Articles

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