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http://ir.ncue.edu.tw/ir/handle/987654321/12292
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| Title: | Effects of annealing temperature on properties of CuIn (Se,S)2 film prepared by sputtering |
| Authors: | Lin, Yi- Cheng;Chen, Z. J.;Wang, L. C. |
| Contributors: | 機電工程系 |
| Keywords: | Chalcopyrite;CuIn(Ga)Se2;Sputtering |
| Date: | 2012
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| Issue Date: | 2012-07-05T07:11:33Z
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| Abstract: | This paper examines CuIn(Se,S)2 (CISS) films prepared by sputtering precursor films of In, Cu, and In2S3 onto Mo coated soda-lime glass, followed by a single-stage selenium annealing process to form a CISS chalcopyrite phase. In this study, S was substituted for Ga to increase the energy gap of CuInSe-based materials. Experimental results reveal that the composition of (S + Se) and S decreased slightly with an increase in the selenium annealing temperature, exhibiting uniform distribution throughout the entire CISS film sample. The resulting CISS film exhibited p-type conductivity with an energy gap of 1.11eV. The optimum selenium annealing condition for the CIGS precursor prepared by sputtering was 798 K for 20 minutes. |
| Relation: | Applied Mechanics and Materials, 117-119: 1284-1288 |
| Appears in Collections: | [機電工程學系] 期刊論文
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Size | Format | |
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| 2050100210006.pdf | 83Kb | Adobe PDF | 622 | View/Open |
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