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http://ir.ncue.edu.tw/ir/handle/987654321/12467
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題名: | A Numerical Study of Dc Characteristics of HEMT with p-type δ-doped Barrier |
作者: | Chang, Y.;Kuo, Yen-Kuang |
貢獻者: | 物理學系 |
日期: | 2005-09
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上傳時間: | 2012-07-19T01:47:20Z
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出版者: | SpringerLink |
摘要: | The dc characteristics of an InGaP/InGaAs/GaAs pseudomorphic high-electron-mobility transistor (HEMT) with a p-type δ-doped InGaP barrier are numerically investigated with the ISE-TCAD simulation program. The simulation results indicate that a HEMT with such a structure has a higher gate turn-on voltage, better carrier confinement that results in a lower voltage-dependent transconductance, and a larger breakdown voltage when compared with the typical HEMT. The simulation results also suggest that this structure is beneficial for linear and large-signal application. |
關聯: | Applied Physics A: Materials Science & Processing, 81(4): 877-879 |
顯示於類別: | [物理學系] 期刊論文
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