National Changhua University of Education Institutional Repository : Item 987654321/12519
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 6487/11649
造访人次 : 28506704      在线人数 : 406
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 进阶搜寻


题名: Fabrication and Characterization of Temperature Insensitive 660-nm Resonant-Cavity LEDs
作者: Chen, Jun-Rong;Ko, Tsung-Shine;Lu, Tien-Chang;Chang, Yi-An;Kuo, Hao-Chung;Kuo, Yen-Kuang;Tsai, Jui-Yen;Laih, Li-Wen;Wang, Shing-Chung
贡献者: 物理學系
日期: 2008-07
上传时间: 2012-07-19T01:48:18Z
出版者: IEEE
摘要: InGaP/AlGaInP 660-nm resonant-cavity light-emitting diodes (RCLEDs) with stable temperature characteristics have been achieved by extending the resonant cavity length from one optical wavelength (1λ) to three optical wavelengths (3λ) and tripling the number of quantum wells. When the operation temperature increases from 25 °C to 95 °C, the degree of power variation at 20 mA is reduced from -2.1 dB to -0.6 dB for the conventional 1-λ cavity RCLEDs and 3-λ cavity RCLEDs, respectively. In order to interpret the temperature-dependent experimental results, advanced device simulation is applied to model the RCLEDs with different cavity designs. According to the numerical simulation results, we deduce that the stable temperature-dependent output performance should originate from the reduction of electron leakage current and thermally enhanced hole transport for the 3-λ cavity AlGaInP RCLEDs.
關聯: IEEE Journal of Lightwave Technology, 26(13): 1891-1900
显示于类别:[物理學系] 期刊論文


档案 大小格式浏览次数



DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈