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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/13190

Title: Determination of Microdistortion Components and Application to Characterization of InN Thin Films Grown on GaN Template by Molecular beam Epitaxy
Authors: Lee, C. M.;Fan, J. C.;Liu, C. C.;Chen, W. C.;Lo, Y. Y.;Liang, Y. C.;Huang, Man-Fang
Contributors: 光電科技研究所
Date: 2010
Issue Date: 2012-08-07T06:21:10Z
Publisher: 中華民國物理學會
Relation: 2010年中華民國物理年會, BP-121
Appears in Collections:[Graduate Institute of Photonics Technologies] Proceedings

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