National Changhua University of Education Institutional Repository : Item 987654321/13190

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NCUEIR > College of Science > Graduate Institute of Photonics Technologies > Proceedings > Item 987654321/13190

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/13190

Title:	Determination of Microdistortion Components and Application to Characterization of InN Thin Films Grown on GaN Template by Molecular beam Epitaxy
Authors:	Lee, C. M.;Fan, J. C.;Liu, C. C.;Chen, W. C.;Lo, Y. Y.;Liang, Y. C.;Huang, Man-Fang
Contributors:	光電科技研究所
Date:	2010
Issue Date:	2012-08-07T06:21:10Z
Publisher:	中華民國物理學會
Relation:	2010年中華民國物理年會, BP-121
Appears in Collections:	[Graduate Institute of Photonics Technologies] Proceedings

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