National Changhua University of Education Institutional Repository : Item 987654321/13477
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6498/11670
Visitors : 25986219      Online Users : 180
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item:

Title: Finite element analysis and die design of non-specific engineering structure of aluminum alloy during extrusion
Authors: Chen, Dyi-Cheng;Lu, Yi-Yu
Contributors: 工業教育與技術學系 
Keywords: Extrusion;Aluminium alloys;Finite element analysis;Plastic deformation
Date: 2010-06
Issue Date: 2012-08-27T06:03:02Z
Abstract: Aluminum extension applies to industrial structure, light load, framework rolls and conveyer system platform. Many factors must be controlled in processing the non‐specific engineering structure (hollow shape) of the aluminum alloy during extrusion, to obtain the required plastic strain and desired tolerance values. The major factors include the forming angle of the die and temperature of billet and various materials. This paper employs rigid‐plastic finite element (FE) DEFORM™ 3D software to investigate the plastic deformation behavior of an aluminum alloy (A6061, A5052, A3003) workpiece during extrusion for the engineering structure of the aluminum alloy. This work analyzes effective strain, effective stress, damage and die radius load distribution of the billet under various conditions. The analytical results confirm the suitability of the current finite element software for the non‐specific engineering structure of aluminum alloy extrusion.
Relation: The10th International Conference on Numerical Methods in Industrial Forming Processes, Pohang, Korea, June 15, 2010: 1055-1059
Appears in Collections:[Department of Industrial Education and Technology] Proceedings

Files in This Item:

File SizeFormat
2030100616026.pdf155KbAdobe PDF432View/Open

All items in NCUEIR are protected by copyright, with all rights reserved.


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback