National Changhua University of Education Institutional Repository : Item 987654321/13959

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NCUEIR > College of Engineering > eedept > Periodical Articles > Item 987654321/13959

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/13959

Title:	Periodic Flux Interruption and Sustained Two-dimensional Growth for Molecular Beam Epitaxy
Authors:	Lee, C. P.;Chang, K. H.;Liu, D. G.;Wu, Jenq-Shinn
Contributors:	電子工程學系
Keywords:	Periodic flux interruption;III-V semiconductors;Sustained two-dimensional growth;Molecular beam epitaxy;MBE growth;RHEED intensity oscillation;Ga flux;GaAs
Date:	1989-11
Issue Date:	2012-09-10T02:32:42Z
Publisher:	IEEE
Abstract:	Periodic interruption of Ga flux during MBE growth of GaAs has been used to achieve sustained two-dimensional layer-by-layer growth. RHEED intensity oscillation for extended growth shows no degradation in the oscillation amplitude, indicating an atomically smooth growth front throughout the growth.
Relation:	Electronics Lett., 25(24): 1659-1660
Appears in Collections:	[eedept] Periodical Articles

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