English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6498/11670
Visitors : 25702668      Online Users : 76
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/13970

Title: Precise Determination of Aluminum Content in AlGaAs
Authors: Chang, K. H.;Lee, C. P.;Wu, Jenq-Shinn;Liou, D. G.;Wang, M. H.;Chen, L. J.;Marais, Mario A.
Contributors: 電子工程學系
Date: 1991-11
Issue Date: 2012-09-10T02:33:24Z
Publisher: American Institute of Physics
Abstract: The Al composition of AlGaAs has been determined by four methods: high-resolution transmission electron microscopy (HRTEM) , reflection high-energy electron diffraction (RHEED), photoluminescence (PL), and double-crystal x-ray diffraction (DCXRD) . HRTEM is direct and the most accurate method because it does not involve any formula or extrapolation. Using the result obtained from HRTEM as a standard, we have calibrated the results from other methods. RHEED intensity oscillation is found to-be accurate and reliable, if the growth conditions are correctly chosen. Comparing the PL results with those determined from HRTEM and RHEED, we suggest three formulas to determine the Al contents at different temperatures. We also proposed a polynomial to determine the Al concentration using the DCXRD measurement.
Relation: Journal of Applied Physics, 70(9): 4877-4882
Appears in Collections:[電子工程學系] 期刊論文

Files in This Item:

File SizeFormat

All items in NCUEIR are protected by copyright, with all rights reserved.


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback