National Changhua University of Education Institutional Repository : Item 987654321/14001
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6481/11653
Visitors : 23407330      Online Users : 275
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
NCUEIR > College of Engineering > eedept > Proceedings >  Item 987654321/14001

Please use this identifier to cite or link to this item:

Title: Critical Growth Temperature of Metamorphic Buffer Layer for Low Pinch-off Leakage InAlAs/InGaAs HEMTs on GaAs Substrates
Authors: Wu, Jenq-Shinn;Tsen, J. H.
Contributors: 電子工程學系
Date: 2006
Issue Date: 2012-09-10T02:36:07Z
Relation: International Electron Devices and Material Symposia, : 170
Appears in Collections:[eedept] Proceedings

Files in This Item:

There are no files associated with this item.

All items in NCUEIR are protected by copyright, with all rights reserved.


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback