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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/14005

Title: Reciprocal Space Mapping of High-resolution X-ray Diffraction for InAlAs/InGaAs Metamorphic High Electron Mobility Transistors
Authors: Ke, S. H.;Wu, Jenq-Shinn
Contributors: 電子工程學系
Date: 2008
Issue Date: 2012-09-10T02:36:12Z
Relation: Physical Society Annual Meeting
Appears in Collections:[電子工程學系] 會議論文

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