National Changhua University of Education Institutional Repository : Item 987654321/14005

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NCUEIR > College of Engineering > eedept > Proceedings > Item 987654321/14005

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/14005

Title:	Reciprocal Space Mapping of High-resolution X-ray Diffraction for InAlAs/InGaAs Metamorphic High Electron Mobility Transistors
Authors:	Ke, S. H.;Wu, Jenq-Shinn
Contributors:	電子工程學系
Date:	2008
Issue Date:	2012-09-10T02:36:12Z
Relation:	Physical Society Annual Meeting
Appears in Collections:	[eedept] Proceedings

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