National Changhua University of Education Institutional Repository : Item 987654321/14852
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6507/11669
Visitors : 29951208      Online Users : 580
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister
NCUEIR > College of Science > math > Periodical Articles >  Item 987654321/14852

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/14852

Title: Reducing Over-dispersion by Generalized Degree of Freedom and Propensity Score
Authors: Lian, Ie-Bin
Contributors: 數學系
Keywords: Bias correction;Logistic regression;Confounder selection
Date: 2003-06
Issue Date: 2012-12-10T02:29:20Z
Publisher: Elsevier
Abstract: Assume y is a response variable, x is a risk factor of interest, and z's are covariates, or sometime called "confounders of x" if they are correlated with both x and y. If the covariates are numerous, then model selection procedures are applied on z's while x is usually forced into the model before or after the selection. In this situation, over-dispersion will occur to bias the inference on the relation between x and y. In a linear model, the over-dispersion comes from two sources: an underestimation of the mean-squared error, and a dependency between the estimator of the x-effect and its standard error. The author proposed a method that incorporates the ideas of Ye's generalized degree of freedom and Rosenbaum and Rubin's propensity score. The method reduces the bias and over-dispersion effect to acceptable levels. Data from the Georgia capital charging and sentencing study, which included 1077 observations and 295 covariates, were analyzed as an illustration.
Relation: Computational Statistics & Data Analysis, 43(2): 197-214
Appears in Collections:[math] Periodical Articles

Files in This Item:

File SizeFormat
index.html0KbHTML703View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback