English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6469/11641
Visitors : 19816022      Online Users : 214
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/15326

Title: Analysis of Transport Critical Current Density in a Bent Bi-Pb-Sr-Ca-Cu-O Silver-Sheathed Tape
Authors: Lee, W. D.;Horng, Lance;Yang, T. J.;Chiou, B. S.
Contributors: 物理學系
Date: 1995-06
Issue Date: 2013-02-05T02:17:19Z
Publisher: Elsevier
Abstract: The experimental results on the magnetic behavior of the transport critical current density in a bent Bi based superconducting tape have shown that the irreversible strain limit εirrev for the onset of permanent strain damage to Ag sheathed superconductors is not dependent on the magnetic field, nor does the normalized current depend on the strain at least up to 0.5 T at 77 K. Such a behavior has been attributed to two reasons: (1) The intrinsic pinning properties are unchanged in a bent tape; (2) The strain effect is extrinsic and arises from superconductor cracks. Thus, based on these arguments a Josephson junction tunneling model with cracks in between the grain boundaries is proposed to explain the Jc behavior quite well for a bent granular high-Tc superconducting tape. Our model calculation shows that the critical current density of high-Tc superconductor may be enhanced by increasing the strain tolerance εirrev and the εirrev is determined by the properties of Ag sheathed tape and its related material parameters, which are dependent on the connectivity of the grain boundaries.
Relation: Physica C: Superconductivity, 247(3-4): 215-220
Appears in Collections:[物理學系] 期刊論文

Files in This Item:

File SizeFormat
index.html0KbHTML426View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback