National Changhua University of Education Institutional Repository : Item 987654321/15327
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Title: Thickness Dependence of Tunneling Resistance on NiO Layer of NiFe/NiO/NiFe Thin Films
Authors: Hsu, Y. H.;Kang, P. C.;Wang, J. C.;Wu, J. C.;Horng, Lance
Contributors: 物理學系
Date: 2004
Issue Date: 2013-02-05T02:17:20Z
Relation: The 2004 Annual Meeting of Chinese physical Society in NTHU
Appears in Collections:[Department of Physics] Proceedings

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