National Changhua University of Education Institutional Repository : Item 987654321/15356
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6507/11669
Visitors : 29712826      Online Users : 267
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/15356

Title: Critical Persistent Current for a Loop Formed by a Bi-2223 Ag-sheathed Superconducting Tape
Authors: Horng, Lance;Tai, C. H.
Contributors: 物理學系
Keywords: Superconducting joint;Ag-sheathed tape;Critical current;Persistent mode;Current loop
Date: 2001-03
Issue Date: 2013-02-05T02:18:07Z
Publisher: IEEE
Abstract: A persistent current loop formed by a Bi-2223 Ag-sheathed superconducting tape has been fabricated by tape joint technique. The current decay measurement was used to determine the persistent current of the loop at 77 K. A dc current exceeding the critical current Ic of the loop defined by 1 μV/cm criterion was transmitted into the loop. The persistent current is found to about 25% of its Ic value of the tape. Based on detailed measurements of the voltage-current curves, the low level resistances down to very low voltage (<1 nanovolt) at the jointed and unjointed parts were tested, respectively. The jointed section has a larger Ic value of 1 μV/cm criterion than the unjointed one. However, it is found that the persistent current of this test loop is limited by the jointed section, because the residual resistance of the jointed section is larger. These results illustrate that in the jointed section the flux motion is more serious and the weaker grain boundaries or jointing interfaces limits the persistent transport currents.
Relation: IEEE Trans. on Appl. Superconductivity, 11(1): 3006-3009
Appears in Collections:[Department of Physics] Periodical Articles

Files in This Item:

File SizeFormat
index.html0KbHTML519View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback