English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6469/11641
Visitors : 19812326      Online Users : 217
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/15403

Title: Rotation Angle of Magneto-optical Kerr Effect with Different Capping Layer on CoFe Film
Authors: Wu, Kuo-Ming;Wang, Jia-Feng;Chen, Kuang-Ching;Wu, Jong-Ching;Horng, Lance
Contributors: 物理學系
Keywords: Kerr effect;Rotation angle;Capping layer
Date: 2007-03
Issue Date: 2013-02-05T02:19:36Z
Publisher: Elsevier
Abstract: To understand the influence of rotation angle in magneto-optical effect between conductor and insulator capping layer, we fabricate Co50Fe50/Ta, Co50Fe50/MgO, and Co50Fe50/SiNx bilayers with fixed CoFe thickness and modulated capping layer to systematically study the dependence on the thickness and material of capping layer. We also changed the CoFe thickness with fixed Ta. The switching characteristics were studied using longitudinal magneto-optic Kerr effect (LMOKE) techniques. The hysteresis loops (MH loops) and the coercivity measured by AGM are independent of the capping layer. Our data show the Kerr rotation angle as a function of capping layer thickness. Based on our calculations, the effective rotation angle changes with different capping material. The phenomenon of the increasing Kerr rotation angle is known to be dependent on the dielectric constant and refractive index of the capping layer. A comparison between the rotation angle in LMOKE and the material property has led to a better understanding of the relationship of light refracted in Ta, MgO and SiNx.
Relation: J. Magn. Magn. Mater., 310(2): e944-e946
Appears in Collections:[物理學系] 期刊論文

Files in This Item:

File SizeFormat
index.html0KbHTML383View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback