Loading...
|
Please use this identifier to cite or link to this item:
http://ir.ncue.edu.tw/ir/handle/987654321/15428
|
Title: | Structural, Electrical, Optical and Magnetic Properties of Co0.2AlxZn0.8−xO Films |
Authors: | Tsai, Chia-Lung;Lin, Yow-Jon;Liu, Chia-Jyi;Horng, Lance;Shih, Yu-Tai;Wang, Mu-Shan;Huang, Chao-Shien;Jhang, Chuan-Sheng;Chen, Ya-Hui;Chang, Hsing-Cheng |
Contributors: | 物理學系 |
Keywords: | Photoluminescence;Zinc oxide;X-ray diffraction;Magnesium;Oxides |
Date: | 2009-07
|
Issue Date: | 2013-02-05T02:20:25Z
|
Publisher: | Elsevier |
Abstract: | Co0.2AlxZn0.8−xO films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol–gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co0.2AlxZn0.8−xO diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co0.2AlxZn0.8−xO film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co0.2AlxZn0.8−xO films prepared by the sol–gel method. |
Relation: | Applied Surface Science, 255(20): 8643-8647 |
Appears in Collections: | [物理學系] 期刊論文
|
Files in This Item:
File |
Size | Format | |
index.html | 0Kb | HTML | 632 | View/Open |
|
All items in NCUEIR are protected by copyright, with all rights reserved.
|