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Title: Structural, Electrical, Optical and Magnetic Properties of Co0.2AlxZn0.8−xO Films
Authors: Tsai, Chia-Lung;Lin, Yow-Jon;Liu, Chia-Jyi;Horng, Lance;Shih, Yu-Tai;Wang, Mu-Shan;Huang, Chao-Shien;Jhang, Chuan-Sheng;Chen, Ya-Hui;Chang, Hsing-Cheng
Contributors: 物理學系
Keywords: Photoluminescence;Zinc oxide;X-ray diffraction;Magnesium;Oxides
Date: 2009-07
Issue Date: 2013-02-05T02:20:25Z
Publisher: Elsevier
Abstract: Co0.2AlxZn0.8−xO films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol–gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co0.2AlxZn0.8−xO diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co0.2AlxZn0.8−xO film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co0.2AlxZn0.8−xO films prepared by the sol–gel method.
Relation: Applied Surface Science, 255(20): 8643-8647
Appears in Collections:[物理學系] 期刊論文

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