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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/15796

Title: Shapiro Steps Observed in a Superconducting Single Electron Transistor
Authors: Liou, Saxon;Kuo, Watson;Suen, Y. W.;Hsieh, W. H.;Wu, Cen-Shawn;Chen, C. D.
Contributors: 物理學系
Date: 2007-04
Issue Date: 2013-03-12T04:06:26Z
Publisher: 中華民國物理學會
Abstract: The dc current-voltage (Ⅳ) characteristics of a superconducting single electron transistor irradiated with microwaves up to 18 GHz are experimentally studied. The switching current as a function of gate voltage demonstrates clear phase-charge duality in a Josephson junction. At higher microwave power levels, Shapiro steps in Ⅳ characteristics are observed. The step height in Ⅳ can be analyzed using the model an ac-voltage source applied to a single Josephson junction.
Relation: Chinese Journal of Physics, 45(2): 230-236
Appears in Collections:[物理學系] 期刊論文

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