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題名: Shapiro Steps Observed in a Superconducting Single Electron Transistor
作者: Liou, Saxon;Kuo, Watson;Suen, Y. W.;Hsieh, W. H.;Wu, Cen-Shawn;Chen, C. D.
貢獻者: 物理學系
日期: 2007-04
上傳時間: 2013-03-12T04:06:26Z
出版者: 中華民國物理學會
摘要: The dc current-voltage (Ⅳ) characteristics of a superconducting single electron transistor irradiated with microwaves up to 18 GHz are experimentally studied. The switching current as a function of gate voltage demonstrates clear phase-charge duality in a Josephson junction. At higher microwave power levels, Shapiro steps in Ⅳ characteristics are observed. The step height in Ⅳ can be analyzed using the model an ac-voltage source applied to a single Josephson junction.
關聯: Chinese Journal of Physics, 45(2): 230-236
顯示於類別:[物理學系] 期刊論文


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