English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6498/11670
Visitors : 25620421      Online Users : 195
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/15846

Title: Object-Oriented Development of the Embedded System Based on Petri-Nets
Authors: Huang, Chun-Che;Liang, Wen-Yau
Contributors: 資訊管理學系
Keywords: Embedded system;Object-oriented;Petri-net;Reachability tree;Generalized label-correcting algorithm
Date: 2004-05
Issue Date: 2013-03-12T04:15:50Z
Publisher: Elsevier
Abstract: Embedded systems are an emerging field that has commanded attention and support from the industrial community. They have been a part of daily life today. However, complex behaviors and a lack of reusability and modularization have been obstacles to the development of successful embedded systems. A typical issue or challenge of embedded system design lies on the synthesis of software and hardware. Currently, a paradigm shift towards object-oriented (OO) techniques has been advocated in hope of increasing the reusability and modularization. In this paper, an object-oriented development method of the embedded system based on Petri-nets is proposed. The concurrent ability of Petri-nets assists the concurrent co-design of embedded systems synchronously. In addition, the paper applies the reachability tree and the generalized label-correcting (GLC) algorithm to analyze and to validate the designed processes in object-oriented Petri-net models. This solution approach is novel in a sense that by combining various operators and comparators, different types of developing problems in embedded systems can be solved with one algorithm for different values of the initial node.
Relation: Computer Standards & Interfaces, 26(3): 187-203
Appears in Collections:[資訊管理學系所] 期刊論文

Files in This Item:

File SizeFormat

All items in NCUEIR are protected by copyright, with all rights reserved.


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback