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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/16726

Title: Analysis of TEM Image Contrast of Quaotum-Dot Semiconductor Clusters in Glasses
Authors: Liu, Li‐Chi;Subhash H. Risbud
Contributors: 物理學系
Date: 1990
Issue Date: 2013-06-05T07:45:43Z
Publisher: Taylor & Francis Ltd.
Abstract: Nanometre-size semiconductor clusters trapped in glass matrices represent a novel class of nonlinear optical materials. Microstructural characterization of these materials by conventional and high-resolution transmission electron microscopy (TEM and HRTEM) shows the sensitivity of bright-field image contrast to the nature of the specific II–VI semiconductors (CdS, CdSe) precipitated in the glass matrices. An analysis based on electron-scattering intensity and structure-factor calculations is presented to account for the quality of TEM and HRTEM images observed for CdS- and CdSe-containing quantum-dot glasses.
Relation: Philosophical Magazine Letters, 61(6): 327-332
Appears in Collections:[物理學系] 期刊論文

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