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Please use this identifier to cite or link to this item:
http://ir.ncue.edu.tw/ir/handle/987654321/16726
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| Title: | Analysis of TEM Image Contrast of Quaotum-Dot Semiconductor Clusters in Glasses |
| Authors: | Liu, Li‐Chi;Subhash H. Risbud |
| Contributors: | 物理學系 |
| Date: | 1990
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| Issue Date: | 2013-06-05T07:45:43Z
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| Publisher: | Taylor & Francis Ltd. |
| Abstract: | Nanometre-size semiconductor clusters trapped in glass matrices represent a novel class of nonlinear optical materials. Microstructural characterization of these materials by conventional and high-resolution transmission electron microscopy (TEM and HRTEM) shows the sensitivity of bright-field image contrast to the nature of the specific II–VI semiconductors (CdS, CdSe) precipitated in the glass matrices. An analysis based on electron-scattering intensity and structure-factor calculations is presented to account for the quality of TEM and HRTEM images observed for CdS- and CdSe-containing quantum-dot glasses. |
| Relation: | Philosophical Magazine Letters, 61(6): 327-332 |
| Appears in Collections: | [物理學系] 期刊論文
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