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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/16755

Title: Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of NaV2O5
Authors: Zhang, G. P.;T. A. Callcott;G. T. Woods;Lin, Lin;Brian Sales;D. Mandrus;He, J.
Contributors: 物理學系
Date: 2002-02
Issue Date: 2013-06-05T07:59:15Z
Publisher: The American Physical Society
Abstract: Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV2O5. In contrast to single photon techniques, RIXS at the vanadium L3 edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U = 3.0�0.2eV.
Relation: Physical Review Letters, 88(7): 077401
Appears in Collections:[物理學系] 期刊論文

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