Loading...
|
Please use this identifier to cite or link to this item:
http://ir.ncue.edu.tw/ir/handle/987654321/16755
|
| Title: | Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of NaV2O5 |
| Authors: | Zhang, G. P.;T. A. Callcott;G. T. Woods;Lin, Lin;Brian Sales;D. Mandrus;He, J. |
| Contributors: | 物理學系 |
| Date: | 2002-02
|
| Issue Date: | 2013-06-05T07:59:15Z
|
| Publisher: | The American Physical Society |
| Abstract: | Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV2O5. In contrast to single photon techniques, RIXS at the vanadium L3 edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U = 3.0�0.2eV. |
| Relation: | Physical Review Letters, 88(7): 077401 |
| Appears in Collections: | [物理學系] 期刊論文
|
Files in This Item:
| File |
Size | Format | |
|---|
| index.html | 0Kb | HTML | 510 | View/Open |
|
All items in NCUEIR are protected by copyright, with all rights reserved.
|
