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NCUEIR > College of Engineering > Department and Graduate Institute of Electronic Engineering > Proceedings > Item 987654321/1718

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/1718

Title:	Spatial Scanning-Probe Array System for Silicon-on-Insulator Integrated Circuits
Authors:	Wen-Ren Yang
Contributors:	電機工程學系
Date:	2008
Issue Date:	2010-11-12T06:55:08Z
Abstract:	A spatial scanning-probe array system for silicon-oninsulator (SOI) integrated circuit is proposed in this paper. The operating fundamentals, specifications, and simulations are presented in this paper. The proposed system is designed to scan the circuit in order to examine the surface and detect die cracks. The post signal processing by using discrete wavelet transform(DWT) for scattered optical signal is also proposed and simulated.
Relation:	The 51st IEEE Midwest Symposium on Circuits and Systems, August 10-13, 2008:910-913
Appears in Collections:	[Department and Graduate Institute of Electronic Engineering] Proceedings

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