National Changhua University of Education Institutional Repository : Item 987654321/1718
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题名: Spatial Scanning-Probe Array System for Silicon-on-Insulator Integrated Circuits
作者: Wen-Ren Yang
贡献者: 電機工程學系
日期: 2008
上传时间: 2010-11-12T06:55:08Z
摘要: A spatial scanning-probe array system for silicon-oninsulator (SOI) integrated circuit is proposed in this paper. The operating fundamentals, specifications, and simulations are presented in this paper. The proposed system is designed to scan the circuit in order to examine the surface and detect die cracks. The post signal processing by using discrete wavelet transform(DWT) for scattered optical signal is also proposed and
simulated.
關聯: The 51st IEEE Midwest Symposium on Circuits and Systems, August 10-13, 2008:910-913
显示于类别:[電機工程學系] 會議論文

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