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NCUEIR > College of Science > Graduate Institute of Photonics Technologies > Periodical Articles > Item 987654321/17358

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/17358

Title:	Ohmic Performance Comparison for Ti/Ni/Au and Ti/Pt/Au on InAs/graded InGaAs/GaAs Layers
Authors:	Lyu, Yen-Tang;Jaw, Kuo-Liang;Lee, Ching-Ting;Tsai, Chang-Da;Lin, Yow-Jon;Cherng, Ya-Tung
Contributors:	光電科技研究所
Keywords:	Nonalloyed ohmic contact;Metal-semiconductor contact;Specific contact resistance
Date:	2000-02
Issue Date:	2013-10-02T08:35:25Z
Publisher:	Elsevier B. V.
Abstract:	Metallization systems of Ti/Ni/Au and Ti/Pt/Au were deposited onto InAs/graded InGaAs/GaAs epitaxial layers grown on GaAs substrate. Both of them exhibit good nonalloyed specific contact resistance of 1.0 × 10−6 and 3.0 × 10−6 Ω cm2 for Ti/Pt/Au and Ti/Ni/Au metallization systems, respectively. However, the thermal stability can be achieved at least up to 350°C for Ti/Pt/Au metallization system, while the Ti/Ni/Au metallization can only thermally stabilize at 250°C. The degradation of the specific contact resistance at high annealing temperature is attributed to the induced decomposition of InAs and graded InGaAs layers. Rutherford backscattering spectroscopy spectra and Auger electron spectroscopy depth profile were used to study the physical mechanism.
Relation:	Materials Chemistry and Physics, 63(2): 122-126
Appears in Collections:	[Graduate Institute of Photonics Technologies] Periodical Articles

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