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http://ir.ncue.edu.tw/ir/handle/987654321/17397
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| Title: | Effects of the Thickness of Capping Layers on Electrical Properties of Ni Ohmic Contacts on p-AlGaN and p-GaN using an Ohmic Recessed Technique |
| Authors: | Lin, Yow-Jon;Chu, Yow-Lin |
| Contributors: | 光電科技研究所 |
| Keywords: | Semiconductors;Surfaces, interfaces and thin films |
| Date: | 2006-08
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| Issue Date: | 2013-10-02T08:36:41Z
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| Publisher: | IOP Publishing Ltd |
| Abstract: | In this study, the effects of the thickness of p-GaN (p-InGaN) capping layers grown on top of p-AlGaN (p-GaN) on electrical properties of Ni ohmic contacts on p-AlGaN (p-GaN) were investigated. The experiments and simulations indicated that the thicker p-GaN (p-InGaN) capping layer grown on p-AlGaN (p-GaN) led to the formation of the higher concentration of a two-dimensional hole gas (2DHG) at the interfaces. Consequently, we deduce that holes can be easily injected into the p-AlGaN (p-GaN) layer through recessed channels and a 2DHG channel, which results in the formation of the low contact resistivity. This provides a rational guideline for the development of new processing methodologies to enhance nitride semiconductor-based optoelectronic devices. |
| Relation: | Semiconductor Science Technology, 21(8): 1172-1175 |
| Appears in Collections: | [光電科技研究所] 期刊論文
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