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题名: Mechanisms of Performance Improvement for Polymer Light-Emitting Diodes Fabricated on (NH4)2Sx-Treated Indium-Tin Oxide Substrates
作者: Lin, Yow-Jon;You, Chang-Feng;Chou, Wei-Yang;Lin, Shih-Ting
贡献者: 光電科技研究所
关键词: Organic light emitting diodes;Photoelectron spectra;Vacancies (crystal);Work function;Leakage currents;Surface treatment
日期: 2006-09
上传时间: 2013-10-02T08:36:44Z
出版者: The Electrochemical Society
摘要: Photoelectron spectroscopy measurements show that (NH4)2Sx surface treatment may lead to an increase in the work function of indium-tin oxide (ITO), due to the occupation of oxygen vacancies (VO) by sulfur and a reduction in the amount of VO near the ITO surface region. Comparison between the current-luminance-voltage characteristics of polymer light-emitting diodes fabricated on ITO substrates with and without (NH4)2Sx treatment, shows that (NH4)2Sx treatment led to the enhancement of external quantum efficiency, due to the reduction of forward-biased leakage current (resulting from the reduction of VO-related defects near the ITO surface region).
關聯: Electrochemical and Solid-State Letters, 9(10): G302-G304
显示于类别:[光電科技研究所] 期刊論文

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