Loading...
|
Please use this identifier to cite or link to this item:
http://ir.ncue.edu.tw/ir/handle/987654321/17407
|
| Title: | Effects of (NH4)2Sx Treatment on Surface Work Function and Roughness of Indium–tin-oxide |
| Authors: | Lin, Yow-Jon;You, Chang-Feng;Tsai, Chia-Lung |
| Contributors: | 光電科技研究所 |
| Keywords: | Surface treatment;ITO;Work function;XPS |
| Date: | 2007-02
|
| Issue Date: | 2013-10-02T08:36:50Z
|
| Publisher: | Elsevier B. V. |
| Abstract: | In this study, the effects of an (NH4)2Sx treatment on the surface work function (SWF) and roughness of indium–tin-oxide (ITO) have been investigated. From the observed X-ray photoelectron spectroscopy results, optical transmittance measurements, atomic force microscopy measurements and four-point probe measurements, it is suggested that the surface chemical changes and an increase in the sheet resistance had strong effects on the SWF of ITO. We find that the S occupation of oxygen vacancies near the ITO surface after (NH4)2Sx treatment may result in a marked increase in the SWF and a slight increase in the surface roughness. |
| Relation: | Applied Surface Science, 253(8): 3957-3961 |
| Appears in Collections: | [光電科技研究所] 期刊論文
|
Files in This Item:
| File |
Size | Format | |
|---|
| index.html | 0Kb | HTML | 446 | View/Open |
|
All items in NCUEIR are protected by copyright, with all rights reserved.
|
