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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/17407

Title: Effects of (NH4)2Sx Treatment on Surface Work Function and Roughness of Indium–tin-oxide
Authors: Lin, Yow-Jon;You, Chang-Feng;Tsai, Chia-Lung
Contributors: 光電科技研究所
Keywords: Surface treatment;ITO;Work function;XPS
Date: 2007-02
Issue Date: 2013-10-02T08:36:50Z
Publisher: Elsevier B. V.
Abstract: In this study, the effects of an (NH4)2Sx treatment on the surface work function (SWF) and roughness of indium–tin-oxide (ITO) have been investigated. From the observed X-ray photoelectron spectroscopy results, optical transmittance measurements, atomic force microscopy measurements and four-point probe measurements, it is suggested that the surface chemical changes and an increase in the sheet resistance had strong effects on the SWF of ITO. We find that the S occupation of oxygen vacancies near the ITO surface after (NH4)2Sx treatment may result in a marked increase in the SWF and a slight increase in the surface roughness.
Relation: Applied Surface Science, 253(8): 3957-3961
Appears in Collections:[光電科技研究所] 期刊論文

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