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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/17443

Title: Comment on “Depletion width Measurement in an Organic Schottky Contact using a Metal-semiconductor Field-effect Transistor” [ Appl. Phys. Lett. 91, 083513 (2007) ]
Authors: Lin, Yow-Jon
Contributors: 光電科技研究所
Keywords: Localised states;Organic field effect transistors;Organic semiconductors;Schottky barriers;Semiconductor-metal boundaries
Date: 2010-08
Issue Date: 2013-10-02T08:37:20Z
Publisher: American Institute of Physics
Relation: Applied Physics Letters, 97(9): 096101
Appears in Collections:[光電科技研究所] 期刊論文

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