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NCUEIR > College of Science > Graduate Institute of Photonics Technologies > Periodical Articles > Item 987654321/17443

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/17443

Title:	Comment on “Depletion width Measurement in an Organic Schottky Contact using a Metal-semiconductor Field-effect Transistor” [ Appl. Phys. Lett. 91, 083513 (2007) ]
Authors:	Lin, Yow-Jon
Contributors:	光電科技研究所
Keywords:	Localised states;Organic field effect transistors;Organic semiconductors;Schottky barriers;Semiconductor-metal boundaries
Date:	2010-08
Issue Date:	2013-10-02T08:37:20Z
Publisher:	American Institute of Physics
Relation:	Applied Physics Letters, 97(9): 096101
Appears in Collections:	[Graduate Institute of Photonics Technologies] Periodical Articles

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