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題名: | On the Origin of the Ferromagnetism in Zn0.8Mn0.2O Having a Higher Curie Temperature than Zn0.8Co0.2O |
作者: | Tsai, Chia-Lung;Lin, Yow-Jon;Chen, Jia-Hong;Chang, Hsing-Cheng;Chen, Ya-Hui;Horng, Lance;Shih, Yu-Tai |
貢獻者: | 光電科技研究所 |
關鍵詞: | A. Semiconductors;A. Thin films;C. Point defects |
日期: | 2012-03
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上傳時間: | 2013-10-02T08:37:34Z
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出版者: | Elsevier B. V. |
摘要: | Zn 0.8Co 0.2O and Zn 0.8Mn 0.2O films were deposited on substrates by a solgel technique. X-ray diffraction, field-emission scanning electron microscopy, photoluminescence, and ferromagnetism measurements were used to characterize these dilute magnetic semiconductors. It is shown that the ferromagnetic properties might be related to the formation of acceptor-like defects in the Zn 0.8Co 0.2O and Zn 0.8Mn 0.2O films. It is found that ferromagnetic Zn 0.8Mn 0.2O has a higher Curie temperature than Zn 0.8Co 0.2O. In addition, the higher ratio of grain-boundary area to grain volume of Zn 0.8Mn 0.2O than Zn 0.8Co 0.2O indicates that grain boundaries and related acceptors are the intrinsic origin for ferromagnetism. � 2011 Elsevier Ltd. All rights reserved. |
關聯: | Solid State Communications, 152(6): 488-492 |
顯示於類別: | [光電科技研究所] 期刊論文
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