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题名: On the Origin of the Ferromagnetism in Zn0.8Mn0.2O Having a Higher Curie Temperature than Zn0.8Co0.2O
作者: Tsai, Chia-Lung;Lin, Yow-Jon;Chen, Jia-Hong;Chang, Hsing-Cheng;Chen, Ya-Hui;Horng, Lance;Shih, Yu-Tai
贡献者: 光電科技研究所
关键词: A. Semiconductors;A. Thin films;C. Point defects
日期: 2012-03
上传时间: 2013-10-02T08:37:34Z
出版者: Elsevier B. V.
摘要: Zn 0.8Co 0.2O and Zn 0.8Mn 0.2O films were deposited on substrates by a solgel technique. X-ray diffraction, field-emission scanning electron microscopy, photoluminescence, and ferromagnetism measurements were used to characterize these dilute magnetic semiconductors. It is shown that the ferromagnetic properties might be related to the formation of acceptor-like defects in the Zn 0.8Co 0.2O and Zn 0.8Mn 0.2O films. It is found that ferromagnetic Zn 0.8Mn 0.2O has a higher Curie temperature than Zn 0.8Co 0.2O. In addition, the higher ratio of grain-boundary area to grain volume of Zn 0.8Mn 0.2O than Zn 0.8Co 0.2O indicates that grain boundaries and related acceptors are the intrinsic origin for ferromagnetism. � 2011 Elsevier Ltd. All rights reserved.
關聯: Solid State Communications, 152(6): 488-492
显示于类别:[光電科技研究所] 期刊論文


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