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NCUEIR > College of Science > Graduate Institute of Photonics Technologies > Proceedings > Item 987654321/17477

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/17477

Title:	The Characterization of Mg Implanted GaN Material
Authors:	Tsai, C. D.;Lin, Yow-Jon;Lee, C. T.
Contributors:	光電科技研究所
Date:	1999
Issue Date:	2013-10-02T08:38:49Z
Publisher:	Progress in Electromagnetics Research Symposium(PIERS)
Relation:	Progress in Electromagnetics Research Symposium(PIERS), : 529
Appears in Collections:	[Graduate Institute of Photonics Technologies] Proceedings

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