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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/17526

Title: Electrical Characterization of Ni/Au Schottky Barrier on P-type GaN Based on Transmission Line Model
Authors: Lin, Yow-Jon
Contributors: 光電科技研究所
Date: 2007-11
Issue Date: 2013-10-02T08:39:35Z
Publisher: 中華民國光電學會
Relation: 2007台灣光電科技研討會
Appears in Collections:[光電科技研究所] 會議論文

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