National Changhua University of Education Institutional Repository : Item 987654321/17783
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 6491/11663
造访人次 : 23827542      在线人数 : 122
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 进阶搜寻

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.ncue.edu.tw/ir/handle/987654321/17783

题名: Analytical and T-CAD Modeling of Pentacene Thin-Film Transistors
作者: Chen, Yet-Min;Chen, Yu-Sheng;Huang, Jian-Jang;Lee, Jiun-Haw;Wang, Yu-Wu;Wang, Yi-Kai
贡献者: 光電科技研究所
日期: 2006
上传时间: 2013-12-30T09:46:30Z
出版者: International Society for Optical Engineering
摘要: Many researches report that the mobility in organic material is dependent on not only the gate field but also the grain size. There is also some evidence to prove that the gate length is strongly related to the carrier mobility. We construct both the analytical model of organic thin film transistor and the large signal circuit model designed by T-CAD to fit the measured I DS - V DS curves. We first apply basic I DS - V DS equations in both triode and saturation regions with mobility μ best fitted to measured I-V curves. The "best-fitted" μ increases with the gate length, and is related to the increase of total channel resistance due to the presence of small grains size of pentacene next to source/drain electrodes. We then use the Advanced Design System software to design the large signal circuit model. Similar to the MOSFET, we add the additional parameters to fit the I DS - V DS curves, ex: Rgd, Rgs, and Rp. Here, Rgd. With the circuit simulation, we find that Rgd presents the leakage current from gate to source, and it affects the slope of curves in the saturation region in the I DS - V DS curves. The equivalent circuit can fit the I DS - V DS curves very well with the proper parameter set.
關聯: Proceedings of SPIE, 6336: 63361H
显示于类别:[光電科技研究所] 會議論文

文件中的档案:

档案 大小格式浏览次数
2020600616002.pdf48KbAdobe PDF351检视/开启


在NCUEIR中所有的数据项都受到原著作权保护.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈