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Title: Extended Depth of Field in a Projected Fringe Profilometry Using a Phase Mask
Authors: Su, Wei-Chia;Su, Wei-Hung;She, Chung-Shang
Contributors: 光電科技研究所
Date: 2009
Issue Date: 2014-04-01T04:01:27Z
Relation: Tech. Digest of MOC'09, J59
Appears in Collections:[Graduate Institute of Photonics Technologies] Proceedings

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