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題名: A Novel Technique for the Study of Defects Using Quantum Wires
作者: Smith, Doran D.;Wybourne, Martin;Wu, Jong-Ching;DeAnni, A.;LeMeune, Mary-Lloyd;Moerkirk, Robert P.;Chang, Wayne H.;Fotiadis, Lemonia
貢獻者: 物理學系
日期: 1994-07
上傳時間: 2014-06-06T07:16:54Z
出版者: Elsevier
摘要: A technique utilizing changes in the conductance of a quantum wire to measure the detrapping time and density of electron traps is described. The technique permits the study of defects in heterostructure material over a wide range of doping levels and under a variety of conditions. The technique also introduces the possibility of studying one microsecond or faster (de)trapping times.
關聯: Solid State Communications, 91(4): 313-317
顯示於類別:[物理學系] 期刊論文


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