English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6469/11641
Visitors : 18482283      Online Users : 169
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18487

Title: Magnetic Domain Pinning in Lithographically Patterned Amorphous Magnetic Layer
Authors: Wu, Jong-Ching;Huang, Ying-Wen;Chen, Bing-Mau;Wu, Te-Ho;Shieh, Han-Ping D.
Contributors: 物理學系
Keywords: Magnetic domain pinning;Magneto-optical;Radial hole array;Electron beam lithograhy;Kerr microscope;Magnetic force microscope
Date: 1999-03
Issue Date: 2014-06-06T07:17:43Z
Publisher: The Japan Society of Applied Physics
Abstract: Artificial pinning sites have been fabricated for the magnetic domain pinning in perpendicular anisotropy magneto-optical (MO) thin film media. The pinning sites were radial hole array made by patterning a layer of radial gold grid on the silicon nitride (SiN) coated silicon (Si) substrate using a standard electron beam lithography. Various magnetization and demagnetization procedures were performed to investigate the magnetic domain pinning behavior. A polar Kerr microscope was used in situ to monitor the magnetic wall motion and a magnetic force microscope was employed to scan the magnetic domain structures. Magnetic domains were found to be pinned inside the hole array and resembled to the geometric shape of the holes. The coercivity in the patterned MO layer is much higher than in the unpatterned MO layer. Moreover, the coercivity in the larger pinning sites area is higher than in the smaller pinning sites area.
Relation: Japanese Journal of Applied Physics, 38(3B): 1832-1834
Appears in Collections:[物理學系] 期刊論文

Files in This Item:

File SizeFormat
index.html0KbHTML545View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback