National Changhua University of Education Institutional Repository : Item 987654321/18491
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题名: In-situ Investigation of Patterned Magnetic Domain Structures Using Magnetic Force Microscope
作者: Wu, Jong-Ching;Huang, Y. W.;Huang, H. W.;Wu, Te-Ho
贡献者: 物理學系
关键词: Electron beam lithography;Magnetic domain structures;Magnetic force microscope
日期: 1999-09
上传时间: 2014-06-06T07:17:46Z
出版者: IEEE
摘要: A novel method for in-situ investigation of patterned magnetic domain structures is presented. Micron-length scales of permalloy thin film fabricated by a lift-off process using electron beam lithography were placed on the top and adjacent to an aluminum strip. A magnetic force microscope was used to take continuous images of the patterned permalloy films while an electrical current was applied in the aluminum strip, with which a magnetic field was established through the patterned permalloy films in the perpendicular and plane direction. As a result, changes of the magnetic domain structures were observed in the presence of the applied magnetic field
關聯: IEEE Transactions on Magnetics, 35(5): 3481-3483
显示于类别:[物理學系] 期刊論文

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