National Changhua University of Education Institutional Repository : Item 987654321/18495
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 6507/11669
造访人次 : 29995691      在线人数 : 292
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 进阶搜寻

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.ncue.edu.tw/ir/handle/987654321/18495

题名: Geometric Shape Dependence of Coercivity for Patterned Magnetic Thin Film
作者: Wu, Te-Ho;Wu, Jong-Ching;Wu, C. S.;Chen, Bing-Mau;Shieh, Han-Ping D.
贡献者: 物理學系
关键词: Coercivity;E-beam lithography;Micro-structure;Shaped-dependence;Canting
日期: 2000-02
上传时间: 2014-06-06T07:17:49Z
出版者: Elsevier
摘要: The micro-strips with patterned magnetic domains using electron beam lithography have been made to study the geometric shape dependence of coercivity. The size of the micro-strip is 10 μm×30 μm with 0.5 μm periods hole arrays pattern. Arrays with different types of geometry, such as square-, circle-, and ellipse-shapes have been made. Amorphous rear-earth transition-metal (RE-TM) thin films with magnetic perpendicular anisotropy were deposited on the micro-strips. The extraordinary Hall effect has been employed to measure the hysteresis loop and the coercivity of the sample. We have found that for the same deposited material, the magnitude of coercivity for various shapes are dissimilar. For example, the coercivity of the ellipse-shaped hole arrays is much larger than the coercivity of the square-shaped hole arrays. In addition, we observed that the coercivity of the patterned sites was larger than the sites without patterns for RE-dominated compounds and the coercivity of the patterned sites was smaller than the sites without patterns for TM-dominated compounds. The magnetic moments canting between RE and TM subnetworks will be used to explain the observed phenomena.
關聯: Journal of Magnetism and Magnetic Materials, 209(1-3): 220-223
显示于类别:[物理學系] 期刊論文

文件中的档案:

档案 大小格式浏览次数
index.html0KbHTML530检视/开启


在NCUEIR中所有的数据项都受到原著作权保护.

 

DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈