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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18497

Title: Evolution of Magnetization Reversal on Patterned Magnetic Elements
Authors: Wu, Jong-Ching;Huang, H. W.;Wu, Te-Ho
Contributors: 物理學系
Keywords: Magnetic force microscope;Magnetization reversal;Patterned permalloy thin film
Date: 2000-09
Issue Date: 2014-06-06T07:17:51Z
Publisher: IEEE
Abstract: An in situ observation of magnetic domain structure evolution in the presence of an external magnetic field induced from a live current strip produced underneath patterned permalloy thin films is presented. The signal due to the electrostatic force was avoided during the magnetic force microscope imaging by adding an electrically grounded metal film in-between the patterned films and the current strip. Magnetization reversal on a 6 μm permalloy disk was imaged, whereas magnetic domain structure on higher aspect ratios of ellipse and rectangle permalloy elements showed great changes hut a much higher field was required for magnetization saturation due to their high coercive and saturation fields
Relation: IEEE Transactions on Magnetics, 36(5): 2978-2980
Appears in Collections:[物理學系] 期刊論文

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