National Changhua University of Education Institutional Repository : Item 987654321/18497
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题名: Evolution of Magnetization Reversal on Patterned Magnetic Elements
作者: Wu, Jong-Ching;Huang, H. W.;Wu, Te-Ho
贡献者: 物理學系
关键词: Magnetic force microscope;Magnetization reversal;Patterned permalloy thin film
日期: 2000-09
上传时间: 2014-06-06T07:17:51Z
出版者: IEEE
摘要: An in situ observation of magnetic domain structure evolution in the presence of an external magnetic field induced from a live current strip produced underneath patterned permalloy thin films is presented. The signal due to the electrostatic force was avoided during the magnetic force microscope imaging by adding an electrically grounded metal film in-between the patterned films and the current strip. Magnetization reversal on a 6 μm permalloy disk was imaged, whereas magnetic domain structure on higher aspect ratios of ellipse and rectangle permalloy elements showed great changes hut a much higher field was required for magnetization saturation due to their high coercive and saturation fields
關聯: IEEE Transactions on Magnetics, 36(5): 2978-2980
显示于类别:[物理學系] 期刊論文

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