English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6469/11641
Visitors : 18482300      Online Users : 182
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18535

Title: The Effect of Hole Depth on the Coercivity Distribution and Domain Structure for DyFeCo Thin Films
Authors: Ye, L. X.;Lee, J. M.;Wu, Te-Ho;Wu, Jong-Ching
Contributors: 物理學系
Date: 2005
Issue Date: 2014-06-06T07:18:30Z
Publisher: American Institute of Physics
Abstract: In our previous studies, we indicated that the coercivity of patterned magneto-optical thin film is quite different from nonpatterned samples. However, we only compared the hysteresis loop bulk measurements of the samples. In this study, we measured the microhysteresis curves at an arbitrary position while coercivity distribution was mapped, and observed submicron images of the remnant state of domain reversal patterns. The spatial variations of the coercivity over several depths of hole arrays barrier on patterned film will be reported.
Relation: Journal of Applied Physics, 97(10): 10J704
Appears in Collections:[物理學系] 期刊論文

Files in This Item:

File SizeFormat
index.html0KbHTML271View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback