English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 6507/11669
造訪人次 : 29895912      線上人數 : 293
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 進階搜尋

請使用永久網址來引用或連結此文件: http://ir.ncue.edu.tw/ir/handle/987654321/18535

題名: The Effect of Hole Depth on the Coercivity Distribution and Domain Structure for DyFeCo Thin Films
作者: Ye, L. X.;Lee, J. M.;Wu, Te-Ho;Wu, Jong-Ching
貢獻者: 物理學系
日期: 2005
上傳時間: 2014-06-06T07:18:30Z
出版者: American Institute of Physics
摘要: In our previous studies, we indicated that the coercivity of patterned magneto-optical thin film is quite different from nonpatterned samples. However, we only compared the hysteresis loop bulk measurements of the samples. In this study, we measured the microhysteresis curves at an arbitrary position while coercivity distribution was mapped, and observed submicron images of the remnant state of domain reversal patterns. The spatial variations of the coercivity over several depths of hole arrays barrier on patterned film will be reported.
關聯: Journal of Applied Physics, 97(10): 10J704
顯示於類別:[物理學系] 期刊論文

文件中的檔案:

檔案 大小格式瀏覽次數
index.html0KbHTML475檢視/開啟


在NCUEIR中所有的資料項目都受到原著作權保護.

 

DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回饋